CPS V&V I&F Workshop 2016

CPS Verification&Validation: Industrial Challenges & Foundations
   -- CPS and AI Safety --


The purpose of this NSF-sponsored workshop is to make academic solutions meet industrial challenges with the goal of identifying the most important present and future foundational challenges in CPS V&V (verification & validation) in the advent of increasingly AI-enhanced control in autonomous systems. While industry experiences a strong need for V&V, it can be difficult for experts from industry to get a feeling for the current capabilities of formal V&V techniques and formal guarantees in AI approaches. While academics strive to provide tools and solve questions that they consider of practical relevance, it is not always clear which questions are significant in industrial practices and within range for their approach. That is why this workshop will bring together experts from both academia and industry to provide an open forum for exchange of ideas and to foster collaboration.

While this workshop will allow industry representatives to present and discuss some of the CPS applications challenges they are facing today, we will also gear a significant portion of the workshop toward identifying the fundamental safety and security challenges facing CPS and AI in the future. The workshop will give participants the opportunity to share the most important core ideas and challenges and invite an open discussion to identify the most pressing issues at hand in CPS and AI verification and validation.


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The NSF CPS V&V I&F workshop will follow a similar model as the previous workshop in 2014. The NSF CPS V&V I&F 2016 workshop will take place on May 6, 2016 at Carnegie Mellon University right after the CPS V&V Grand Prix on May 5. The CPS V&V Grand Prix is a final project competition in the Foundations of Cyber-Physical Systems undergraduate course at CMU.



Dates: May 5, 2016 (competition)
May 6, 2016 (workshop)
Place: GHC 6115, Carnegie Mellon University

Any opinions, findings, and conclusions or recommendations expressed in this publication are those of the author(s) and do not necessarily reflect the views of any sponsoring institution.